Improver

Lakshmanan Balasubramanian

Member, Group Technical Staff at Texas Instruments, Senior Member IEEE, MIET, CEng (EngC UK), IPRA & PRI at The IET

Bengaluru Urban, Karnataka

~20 years of professional and research experience and accomplishments in the primary and allied areas of analog and mixed-signal SoC & semiconductor IC design, verification, test and related methodologies with passion towards quality and efficiency improvement. End products include single chip hearing aid, multi-radio connectivity ICs with embedded power management, and ultra low power / lost cost mixed-signal microcontrollers.

I. Circuit design (>10 products):
* Transistor level design of circuits and systems: Custom digital & analog power management circuits
* Custom layout and physical design

II. Simulation based verification of AMS Circuits and systems (20+ products)
* SPICE, Spectre and fast spice based AMS co-sim.
* Low power simulation
* Assertions based verification of analog circuits
* Analog behavioural modelling
* Formal methods for validation and verification of AMS circuits

III. DFX of mixed signal SoC (>5 products)
* Analog DFT, design for IDDQ
* Design for Qualification / Reliability
* Accelerated stress test techniques: HTOL & BI
* Analog fault simulation applied to fault grading, test optimisation and diagnosis
* Signal integrity: Especially IR drop & substrate noise analysis and reduction
* Package stress effects

IV. Silicon validation and characterisation of analog contents in mixed signal SoC (>5 products)
* Analog test optimisation

V. Methodology champion for analog IP design, verification, delivery, SoC integration and test process strategies
* Efficiency improvement: Process, simulation and iteration effort control
* Quality: Checklists, automated checkers and sign-off
* Silicon failure debug, root-cause analysis and irreversible corrective actions/measures (>15 products)
* Static circuit topology checks, Analog verification coverage, Power management & power domain integrity, Stress test optimisation / customisation, Novel fast / early simulation techniques
* Analog fault simulation and its applications
* AMS BIST and test optimisation

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Experience:

• Lead Engineer (Texas Instruments)
• Lead Engineer (Texas Instruments)
• International Professional Registration Advisor (IPRA) & Professional Review Interviewer (PRI) (Institution of Engineering and Technology (IET))
• Senior Member (IEEE)
• Member, Group Technical Staff (Texas Instruments)
• Lead Engineer (Texas Instruments)
• Analog Design Engineer (Nulife Semiconductors India Private Limited)
• Member (IEEE)
• MIET (IET)
• CEng (Chartered Engineer) (Engineering Council, UK)

Skills:

• Failure Analysis
• DFT
• Semiconductor Packaging
• Manufacturing
• Semiconductor Device
• Assertion Based Verification
• Low Voltage Design
• C
• SoC
• Low Power Systems
• CMOS
• ASIC
• Mixed-Signal IC Design
• VLSI CAD
• Silicon Validation
• Dynamic Simulation
• System on a Chip (SoC)
• Application-Specific Integrated Circuits (ASIC)
• Electronics
• Physical Design
• Power Management
• Low-power Design
• Stress Testing
• IC
• Reliability Test
• Embedded Systems
• Reliability
• Simulations
• Static Circuit Checks
• Circuit Design
• EDA
• Semiconductors
• Corrective Actions
• Integrated Circuit Design
• Circuit Analysis
• Analog Behavioural model
• Electronic Circuit Design
• Assertion Based Analog and Mixed Signal Verification
• Debugging
• Mentoring
• Semiconductor Failure Analysis
• Very-Large-Scale Integration (VLSI)
• Analog
• Mixed Signal
• Analog Circuit Design
• Integrated Circuits (IC)
• Root Cause Analysis
• AMS cosimulation
• Analog and mixed signal design
• VLSI